Type testing according to DIN EN 61010-1:2010

Safety regulations for electronic measuring devices are for example defined in the standard DIN EN 61010-1:2010. We explain all required tests based on the example of the new COM5003.
Special focus is paid to the mechanical stress. For portable devices* we pay attention that the housing thickness stands up to the test procedures.

The tests described in the following are:

  • static stress
  • heavy impact by shock and
  • drop test


* also the COM5003 is a portable device because of its mobility

Static stress according to chapter 8.2.1**
The housing of the device under test (DUT) is stressed by a defined test device. This “ball impression test unit” is determined in form, material, weight and dimension by the standard. The DUT has to withstand a force of 30 N.

No deformation.
Test is passed.

Drop test according to chapter 8.3.1**
The COM5003 is placed on a rigid base. One side is lifted up to 25 mm. Now the device will be dropped freely onto the base.

The housing of the COM5003 remains intact. After switching on the device is completely operable.
Test is passed.

Heavy impact by shock according to 8.2.2**
The DUT is placed on a rigid base and will be impacted by a defined test medium (correctly: a steel ball) and from a defined height.

The test medium acts with an impact energy of 5 J and is dropped through a downpipe down to the DUT.
Several points on the device which are reachable during the intended use are chosen for stressing.

… Also the touchscreen is stressed. At this sight not only the device is suffering but some people in the audience :-(

No dangerous splitters emerge.
Test is passed.


** of DIN EN 61010-1:2010

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