Type testing according to DIN EN 61010-1:2010
Safety regulations for electronic measuring devices are for example defined in the standard DIN EN 61010-1:2010. We explain all required tests based on the example of the new COM5003.
Special focus is paid to the mechanical stress. For portable devices* we pay attention that the housing thickness stands up to the test procedures.
The tests described in the following are:
- static stress
- heavy impact by shock and
- drop test
* also the COM5003 is a portable device because of its mobility
Heavy impact by shock according to 8.2.2**
The DUT is placed on a rigid base and will be impacted by a defined test medium (correctly: a steel ball) and from a defined height.
The test medium acts with an impact energy of 5 J and is dropped through a downpipe down to the DUT.
Several points on the device which are reachable during the intended use are chosen for stressing.